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自動化設備

High Speed Gravity Handler
A2-HV、A2-150/173/209/300
Action series gravity handler provide a simple/robust & efficiency/economy handling system for SOP family package in testing. A small footprint machine with short plunger or long plunger option, multi-test site, low jam rate /High UPH and flexible operation interface. Action series provide own socket(Kelvin & non-kelvin), but also compatible for 3rd party socket.
Die Sorting System
HDS-200
A speedy driver IC sorter equipped with 6 waffle-tray bins, and optional back-side inspection function.
Wafer Skeleton Inspection System
WS-100
To scan skeleton die images and analysis / compare to original map file , the process is after die-bond.
Innovative Paste Printer
HSP/QSP Series
Multiple substrates stencil printing application with precisely fiducial mark alignment, auto print with motor squeegee, auto clean for stencil and strips auto load/unload. The system provide robust printing quality and high throughput.
Contact Angle Measuring System
HCA series
A full-auto load/unload contact angle measuring system. To provide auto droplet control, auto dispensing and contact angle auto measuring. The droplet dispensing position is also programmable. For the option, HPC provide semi-auto and manual system for contact angle measuring.
Auto Tray Exchange System
ATX-160
After final testing. To re-fill the non-full tray. To have simple AOI. To have tray exchange for necessary.
New 3rd Optical Inspection System
IBS-50P/IBS-60
To provide an simple and manual inspection environment for Die-bonding & wire-bonding products , the system provide convenient functions for hand-free, easy operation, easy change kit and web-service. Also to avoid the products be damaged and improve the inspection method and speed.
Loader System of Dispenser
MLD-200/MLD-300
Load & unload system with AGV/OHT for Musashi dispenser.
Fillet Height Measure System
FHM-30
To measure the fillet height thickness and the percentage with 5M pixel CCD and Optical ruler, data could be uploaded.It could improve current measure way and speed up the calculation with data upload.
Auto 2D Barcode Reading System
BR-100
To read the 1D/2D barcode on dies in wafer.
Wafer Thickness & Roughness Measurement System
WTR-100
To measure the wafer thickness & roughness.
LCO2 Snow Jet Cleaning Station
CS-50
To clean the object by ACP Snow Jet LCO2 system. Customized equipment.