Johnstech is a global R&D leader in the field of microcircuit testing, providing reliable, cost-effective testing solutions for automotive, commercial, and industrial applications. Founded in 1991 by David Johnson, Johnstech works hand-in-hand with the world’s most respected OSATs, foundries, and EDA companies to develop the most precise and dependable test contactors on the marketplace today. Customer will see the profits increased with Johnstech's lower cost of test ownership and better overall equipment effectiveness. Also, get great Johnstech value-added services such as field applications engineering, field service engineering, and advanced engineering services like electrical and thermal modeling. The data included on this page is a guideline, as there are many factors that determine a contactor's suitability to your test solution. For a customized consultation in Taiwan, contact us or a Johnstech service office.
YARI™ and SHOTO™ are spring probe contactor solutions designed for final test and wafer test. Engineered by industry experts with more than 30 years of spring pin design expertise, Johnstech’s spring probe test solution offers a reliable, cost-effective, top-of-the-line test contactor manufactured for a wide number of applications. This single-ended probe design developed by Johnstech engineers, provides a more consistent CRES performance than traditional pins and is compatibility with floating alignment plates. Within this contactor, spring probes of varying pitches can be combined in a “mix-and-match” configuration, customized by Johnstech to optimize your contactor performance. Spring probe BGA Crown DUT and QFN/LGA Spear tips available.
Johnstech's IQtouch® Wafer Test Solutions are based on a tradition of delivering innovative technologies, while providing industry-leading final test expertise. This WLCSP solution delivers unsurpassed low and stable contact resistance (CRES) with a robust housing. Available in a variety of pitches of 300 microns and above, the IQtouch Micro boasts reliable, repeatable, and accurate results >90GHz.
Features & Benefits |
Frequency | 89.3GHz at 300 µm; 90.6GHz at 350 µm |
Min. Pitch Avail. | ≥ 0.3 mm |
Temperature | -40°C to 175°C |
Current Carry Capability | 1.71A at 300 µm; 1.71A at 350 µm |
Johnstech’s patented ROL® technology provides excellent electrical performance and proven mechanical reliability for Precision Analog, Mixed Signal and RF applications. The Pad ROL® Series provides robust contact/elastomer configurations for the unique challenges of matte tin and NiPdAu packages.
Available Customizable Features
- ESD Protective Housing (-40°C to 155°C)
- Non-Magnetic Contact
- Kelvin Configuration (See Supporting Materials)
- Impedance Matching
Features & Benefits |
Frequency | 33.2GHz |
Min. Pitch Avail. | ≥ 0.3 mm |
Temperature | -65°C to 175°C |
Current Carry Capability | 3.8A, 37.6A |
High Voltage Capable | 16.5kV @ 0.5mm 1.65 pA Leakage Current µm |
For QFP, SO, SOIC, SOJ, PLCC, TSOP and SOT applications, Johnstech's patented ROL® technology provides excellent electrical performance and proven mechanical reliability on Leaded Devices. Whether you are testing Audio & Infotainment, RF, sensors, power management, or other automotive device applications, look for the solution that drives your results toward higher test yields and delivers superior production throughput. Even if you are not testing outside the temperature limits of standard contactors and sockets, the Johnstech’s Leaded ROL additional design features available that will satisfy your most demanding roadmap requirements.
Available Customizable Features
- ESD Protective Housing (-40°C to 155°C)
- Non-Magnetic Contact
- Kelvin Configuration (See Supporting Materials)
- Impedance Matching
Features & Benefits |
Frequency | 31.3GHz |
Min. Pitch Avail. | ≥ 0.3 mm |
Temperature | -65°C to 175°C |
Current Carry Capability | 4.3A, 42.7A |
High Voltage Capable | 16.5kV @ 0.5mm 1.65 pA Leakage Current |